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FXI-CT2250 High-precision walk-in CT inspection system

One machine with multiple functions to meet the needs of micro-focus and large-focus non-destructive testing
Availability:
  • FXI-CT2250


Applications

● Small and medium metal parts

● Composite materials

● Power semiconductors

● Biological samples

● Ceramic devices



Features

▲ One machine with multiple functions to meet the needs of micro-focus and large-focus non-destructive testing

▲ The maximum load-bearing stage of the stage is 30kg, and the testable sample is 300X600mm

▲ Automatic positioning of the best resolution

▲ Rapid reconstruction, combined with high-precision reconstruction in designated areas, accurately analyze customer concerns

▲ 3D point cloud image slice extraction from any angle, accurate analysis

▲ Multi-scale 2D image enhancement, more prominent details

▲ The scanning process is simple and the reconstruction imaging is fast



technical parameter

System parameters

Spatial resolution: >4μm

Minimum defect resolution: > 2μm
Contrast Resolution: Less than 1%
Measurement error: (1.5+L/200) μ m
Radiation protection: <1μ Sv/h, in line with the national GBZ117-2015 standard
Maximum sample diameter: 300mm
Maximum sample length: 600mm
Maximum weight of sample: 30kg
X-ray source Voltage: 225kV
Minimum focal spot: <4μm
Type: open tube
detector Pixel matrix: 3072X3072
Imaging area: 427mmX427mm
Pixel size: 139μm
Machine parameters Equipment size: 1900mm (length) × 1100mm (width) × 1500mm (height)
Equipment weight: <2000kg
Working environment: 0℃~40℃/ 5~90RH
Software function

CT reconstruction and display, slice extraction display and analysis, DR real-time prediction



detection image

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